5YBB
Structural basis underlying complex assembly andconformational transition of the type I R-M system
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 90 |
Detector technology | PIXEL |
Collection date | 2016-01-13 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.98 |
Spacegroup name | P 41 |
Unit cell lengths | 121.600, 121.600, 280.360 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 47.002 - 3.200 |
R-factor | 0.2376 |
Rwork | 0.236 |
R-free | 0.27170 |
RMSD bond length | 0.008 |
RMSD bond angle | 1.622 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | PHENIX (1.8.4_1496) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 3.200 |
Number of reflections | 66781 |
<I/σ(I)> | 27.8 |
Completeness [%] | 95.3 |
Redundancy | 2.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 285 | 0.1 M Tris-HCl, 54% MPD, 0.2 M NH4H2PO4, pH 8.8 |