5VAN
Crystal Structure of Beta-Klotho
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRL BEAMLINE BL14-1 |
Synchrotron site | SSRL |
Beamline | BL14-1 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2016-05-24 |
Detector | RAYONIX MX325HE |
Wavelength(s) | 1.1808 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 48.683, 144.069, 215.612 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 47.488 - 2.202 |
R-factor | 0.1874 |
Rwork | 0.186 |
R-free | 0.21070 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 0.943 |
Refinement software | PHENIX (1.10_2155) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 47.488 | 2.281 |
High resolution limit [Å] | 2.202 | 2.202 |
Rmerge | 0.109 | 0.880 |
Number of reflections | 77797 | 7442 |
<I/σ(I)> | 20.13 | 2.71 |
Completeness [%] | 99.0 | 97 |
Redundancy | 7.1 | 6.9 |
CC(1/2) | 0.997 | 0.763 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | EVAPORATION | 6 | 293 | 14% PEG 4000, 0.1M MES |