5NUH
Crystal structure of SIVmac239 Nef bound to an engineered Hck SH3 domain
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2009-11-17 |
| Detector | MARMOSAIC 225 mm CCD |
| Wavelength(s) | 1.0000 |
| Spacegroup name | P 32 |
| Unit cell lengths | 104.000, 104.000, 53.000 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 45.680 - 2.780 |
| R-factor | 0.194 |
| Rwork | 0.192 |
| R-free | 0.22900 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3ik5 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.027 |
| Data reduction software | XDS ((1.10_2155: ???)) |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.10_2155: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.700 | 2.800 |
| High resolution limit [Å] | 2.780 | 2.780 |
| Rmerge | 0.140 | |
| Number of reflections | 16118 | |
| <I/σ(I)> | 10.7 | 2 |
| Completeness [%] | 100.0 | 99 |
| Redundancy | 5.6 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 8 | 293 | 12% PEG 3350, 0.15 M tri-lithium-citrat, 1% 1.6 hexandiol |
