5MES
MCL1 FAB COMPLEX IN COMPLEX WITH COMPOUND 29
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I03 |
| Synchrotron site | Diamond |
| Beamline | I03 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-04-15 |
| Detector | DECTRIS PILATUS3 X 1M |
| Wavelength(s) | 0.97626 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 168.470, 40.330, 102.840 |
| Unit cell angles | 90.00, 126.11, 90.00 |
Refinement procedure
| Resolution | 81.020 - 2.240 |
| R-factor | 0.182 |
| Rwork | 0.180 |
| R-free | 0.23000 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.110 |
| Data reduction software | MOSFLM |
| Data scaling software | SCALA |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.6) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 81.020 | 2.300 |
| High resolution limit [Å] | 2.240 | 2.240 |
| Rmerge | 0.060 | 0.709 |
| Rmeas | 0.083 | |
| Rpim | 0.057 | |
| Number of reflections | 27132 | |
| <I/σ(I)> | 11.7 | |
| Completeness [%] | 99.4 | |
| Redundancy | 3.3 | 3.3 |
| CC(1/2) | 0.500 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | PEG 8K 10%w/v, PEG 1500 10%w/v |






