5EFT
Structural Basis for Specific Recognition of ssDNA by SRBSDV P9-1 Octamers
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U |
Synchrotron site | SSRF |
Beamline | BL17U |
Temperature [K] | 195 |
Detector technology | DIFFRACTOMETER |
Collection date | 2015-07-10 |
Detector | RIGAKU AFC9 |
Wavelength(s) | 0.987 |
Spacegroup name | C 2 2 21 |
Unit cell lengths | 118.520, 155.720, 157.630 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 29.600 - 2.500 |
R-factor | 0.255 |
Rwork | 0.253 |
R-free | 0.28420 |
RMSD bond length | 0.010 |
RMSD bond angle | 1.314 |
Data reduction software | Coot |
Data scaling software | HKL-2000 |
Phasing software | Coot |
Refinement software | REFMAC (5.7.0029) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 29.600 |
High resolution limit [Å] | 2.180 |
Number of reflections | 65431 |
<I/σ(I)> | 10.1 |
Completeness [%] | 99.3 |
Redundancy | 5.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 293 | 100 mM Trimethylamine N-oxide dihydrate, 100 mM Tris-HCl, 16% Polyethylene glycol monomethyl ether 3000 |