5DXH
p110alpha/p85alpha with compound 5
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 110 |
Detector technology | PIXEL |
Collection date | 2009-07-03 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 1.00000 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 92.660, 121.830, 166.360 |
Unit cell angles | 90.00, 102.33, 90.00 |
Refinement procedure
Resolution | 49.500 - 3.000 |
R-factor | 0.1826 |
Rwork | 0.181 |
R-free | 0.21820 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.010 |
RMSD bond angle | 1.160 |
Data reduction software | XDS |
Data scaling software | SCALA |
Phasing software | MOLREP |
Refinement software | BUSTER (2.11.5) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 3.110 |
High resolution limit [Å] | 3.000 | 3.000 |
Rmerge | 0.411 | |
Number of reflections | 70505 | |
<I/σ(I)> | 12.2 | 2.7 |
Completeness [%] | 97.5 | 97.8 |
Redundancy | 2.9 | 3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | PEG 20000 |