4ZV0
Structure of Tse6 in complex with Tsi6
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 8.2.2 |
Synchrotron site | ALS |
Beamline | 8.2.2 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2014-10-16 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.979 |
Spacegroup name | P 65 |
Unit cell lengths | 83.209, 83.209, 83.758 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 37.261 - 1.401 |
R-factor | 0.1471 |
Rwork | 0.146 |
R-free | 0.16430 |
Structure solution method | SAD |
RMSD bond length | 0.022 |
RMSD bond angle | 1.713 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHENIX |
Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 1.420 |
High resolution limit [Å] | 1.370 | 1.370 |
Rmerge | 0.082 | 0.617 |
Number of reflections | 69121 | |
<I/σ(I)> | 33.5 | |
Completeness [%] | 99.9 | 99.5 |
Redundancy | 15.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 298 | 20% (w/v) PEG 3350, 0.2M ammonium iodide |