4ZQX
A revised partiality model and post-refinement algorithm for X-ray free-electron laser data
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SLAC LCLS BEAMLINE CXI |
Synchrotron site | SLAC LCLS |
Beamline | CXI |
Temperature [K] | 298 |
Detector technology | PIXEL |
Collection date | 2013-03-18 |
Detector | CS-PAD CXI-1 |
Wavelength(s) | 1.3 |
Spacegroup name | I 2 3 |
Unit cell lengths | 106.100, 106.100, 106.100 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 25.008 - 1.460 |
R-factor | 0.1101 |
Rwork | 0.108 |
R-free | 0.15300 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 4s1l |
RMSD bond length | 0.008 |
RMSD bond angle | 1.276 |
Data reduction software | cctbx.xfel |
Phasing software | MOLREP |
Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 25.100 |
High resolution limit [Å] | 1.460 |
Number of reflections | 34369 |
<I/σ(I)> | 12 |
Completeness [%] | 99.5 |
Redundancy | 45.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | IN CELL | 300 | Form naturally within cells |