4ZDH
Crystal structure of JKA6 TCR
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 21-ID-F |
Synchrotron site | APS |
Beamline | 21-ID-F |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2009-10-13 |
Detector | MARMOSAIC 225 mm CCD |
Wavelength(s) | 0.97872 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 44.695, 60.087, 82.462 |
Unit cell angles | 90.00, 91.75, 90.00 |
Refinement procedure
Resolution | 19.490 - 2.098 |
R-factor | 0.1921 |
Rwork | 0.190 |
R-free | 0.22350 |
RMSD bond length | 0.007 |
RMSD bond angle | 1.190 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | PHENIX (1.8.2_1309) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 19.490 | 2.180 |
High resolution limit [Å] | 2.098 | 2.098 |
Rmerge | 0.080 | 0.240 |
Number of reflections | 25704 | |
<I/σ(I)> | 3.4 | 18.5 |
Completeness [%] | 87.9 | 84.3 |
Redundancy | 3.1 | 3.6 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 298 | 0.2 M LITHIUM SULFATE, 0.1 M TRIS-HCL, PEG 4000 |