4YEB
Structural characterization of a synaptic adhesion complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | CHESS BEAMLINE F1 |
Synchrotron site | CHESS |
Beamline | F1 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2014-11-30 |
Detector | ADSC QUANTUM 270 |
Wavelength(s) | 0.918 |
Spacegroup name | P 31 2 1 |
Unit cell lengths | 121.934, 121.934, 83.970 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 14.430 - 3.190 |
R-factor | 0.2651 |
Rwork | 0.257 |
R-free | 0.33570 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 4RMK and 4V2E |
RMSD bond length | 0.009 |
RMSD bond angle | 1.110 |
Data reduction software | XDS |
Data scaling software | SCALA |
Phasing software | PHASER |
Refinement software | BUSTER (2.10.2) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 49.330 | 3.410 |
High resolution limit [Å] | 3.190 | 3.190 |
Rmerge | 0.055 | 0.474 |
Number of reflections | 12230 | |
<I/σ(I)> | 9.4 | 1.5 |
Completeness [%] | 99.7 | 99 |
Redundancy | 1.9 | 1.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 6 % PEG 3350, 0.2 M NaNO3 |