4XFV
Crystal Structure of Elp2
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U |
| Synchrotron site | SSRF |
| Beamline | BL17U |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2012-12-24 |
| Detector | ADSC QUANTUM 315r |
| Wavelength(s) | 0.9792 |
| Spacegroup name | P 61 2 2 |
| Unit cell lengths | 80.645, 80.645, 535.793 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 48.000 - 3.200 |
| R-factor | 0.199 |
| Rwork | 0.199 |
| R-free | 0.24100 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3fm0 |
| RMSD bond length | 0.006 |
| RMSD bond angle | 1.200 |
| Phasing software | PHASER |
| Refinement software | CNS (1.3) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 48.000 |
| High resolution limit [Å] | 3.200 |
| Number of reflections | 16120 |
| <I/σ(I)> | 15 |
| Completeness [%] | 87.8 |
| Redundancy | 20 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 4.8 | 293 | 0.1 M Citric acid, 3.4 M NaCl |
