4XDN
Crystal structure of Scc4 in complex with Scc2n
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-E |
Synchrotron site | APS |
Beamline | 24-ID-E |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2013-04-08 |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 1.000 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 51.579, 177.279, 51.343 |
Unit cell angles | 90.00, 111.11, 90.00 |
Refinement procedure
Resolution | 28.720 - 2.080 |
R-factor | 0.186 |
Rwork | 0.185 |
R-free | 0.21000 |
Structure solution method | SAD |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | SHELXDE |
Refinement software | PHENIX |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 30.000 | 2.140 |
High resolution limit [Å] | 2.079 | 2.079 |
Rmerge | 0.098 | 0.762 |
Number of reflections | 50794 | |
<I/σ(I)> | 9.4 | |
Completeness [%] | 99.9 | 100 |
Redundancy | 3.7 | 3.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 291.15 | overnight growth in .2M ammonium sulfate, 16% (w:v) PEG 3350 |