4RV0
Crystal structure of TN complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | BSRF BEAMLINE 1W2B |
| Synchrotron site | BSRF |
| Beamline | 1W2B |
| Temperature [K] | 100 |
| Detector technology | IMAGE PLATE |
| Collection date | 2012-09-18 |
| Detector | MAR scanner 345 mm plate |
| Wavelength(s) | 0.9791 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 80.146, 83.141, 162.495 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 45.384 - 1.998 |
| R-factor | 0.2104 |
| Rwork | 0.208 |
| R-free | 0.25310 |
| Structure solution method | SAD |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.281 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | AutoSol |
| Refinement software | PHENIX ((phenix.refine: 1.8.1_1168)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.030 |
| High resolution limit [Å] | 1.998 | 2.000 |
| Rmerge | 0.160 | 0.638 |
| Number of reflections | 74127 | |
| <I/σ(I)> | 2.18 | |
| Completeness [%] | 99.8 | 95.6 |
| Redundancy | 14.1 | 6.8 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 289 | 0.1M Tris pH 8.5, 23% w/v polyethylene glycol 3350, 0.2M ammonium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 289K |
