4OU6
Crystal structure of DnaT84-153-dT10 ssDNA complex form 1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U |
Synchrotron site | SSRF |
Beamline | BL17U |
Wavelength(s) | 0.97930 |
Spacegroup name | P 1 |
Unit cell lengths | 47.144, 47.416, 54.135 |
Unit cell angles | 88.34, 86.25, 71.24 |
Refinement procedure
Resolution | 27.540 - 1.960 |
R-factor | 0.19056 |
Rwork | 0.189 |
R-free | 0.22846 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.209 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | MOLREP |
Refinement software | REFMAC (5.7.0032) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 27.540 |
High resolution limit [Å] | 1.960 |
Number of reflections | 30764 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | VAPOR DIFFUSION, HANGING DROP |