4NTD
Crystal structure of HlmI
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2013-09-13 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 1.0 |
Spacegroup name | P 31 2 1 |
Unit cell lengths | 96.350, 96.350, 133.490 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 10.000 - 1.600 |
R-factor | 0.1471 |
Rwork | 0.146 |
R-free | 0.15938 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 4fk1 |
RMSD bond length | 0.006 |
RMSD bond angle | 1.259 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | REFMAC (5.7.0029) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 30.000 | 1.700 |
High resolution limit [Å] | 1.600 | 1.600 |
Rmerge | 0.056 | 0.498 |
Number of reflections | 93867 | |
<I/σ(I)> | 11.2 | 2.2 |
Completeness [%] | 98.9 | 99.9 |
Redundancy | 3.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.3 | 293 | 1.3M Na/K phosphate, pH 7.3, VAPOR DIFFUSION, SITTING DROP, temperature 293K |