4KTH
Structure of A/Hubei/1/2010 H5 HA
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 22-ID |
Synchrotron site | APS |
Beamline | 22-ID |
Temperature [K] | 100 |
Detector technology | IMAGE PLATE |
Collection date | 2011-08-15 |
Detector | MAR scanner 300 mm plate |
Wavelength(s) | 1.0 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 174.121, 101.585, 124.928 |
Unit cell angles | 90.00, 121.66, 90.00 |
Refinement procedure
Resolution | 50.000 - 2.600 |
R-factor | 0.23571 |
Rwork | 0.234 |
R-free | 0.26634 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 2fk0 |
RMSD bond length | 0.006 |
RMSD bond angle | 1.073 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | REFMAC (5.6.0117) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.640 |
High resolution limit [Å] | 2.600 | 2.600 |
Number of reflections | 53820 | |
Completeness [%] | 100 | |
Redundancy | 3.7 | 3.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7 | 293 | 20% PEG MME, 100mM Tris-pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K |