4I5O
Crystal Structure of W-W-R ClpX Hexamer
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-C |
| Synchrotron site | APS |
| Beamline | 24-ID-C |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2009-02-01 |
| Detector | ADSC QUANTUM 315 |
| Wavelength(s) | 0.979 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 55.199, 199.878, 222.279 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 48.319 - 4.479 |
| R-factor | 0.2879 |
| Rwork | 0.286 |
| R-free | 0.32330 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3hws |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.452 |
| Data reduction software | HKL-2000 |
| Data scaling software | SCALEPACK |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.5_2) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 4.660 |
| High resolution limit [Å] | 4.479 | 9.670 | 4.479 |
| Rmerge | 0.077 | 0.041 | 0.278 |
| Number of reflections | 14285 | ||
| <I/σ(I)> | 9.6 | ||
| Completeness [%] | 92.2 | 95.6 | 80.4 |
| Redundancy | 4 | 4.2 | 3.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 9 | 298 | 2.2 M ammonium sulfate, 0.2 M ammonium bromide, 0.1 M Bicine, pH 9.0, VAPOR DIFFUSION, temperature 298K |






