4H8F
Crystal structure of a parallel 4-helix coiled coil CC-Hex-II- 22
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | DIAMOND BEAMLINE I24 |
Synchrotron site | Diamond |
Beamline | I24 |
Detector technology | PIXEL |
Collection date | 2011-08-22 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.97 |
Spacegroup name | P 41 2 2 |
Unit cell lengths | 46.670, 46.670, 94.060 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 46.670 - 1.880 |
R-factor | 0.20878 |
Rwork | 0.207 |
R-free | 0.24324 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3r46 |
RMSD bond length | 0.014 |
RMSD bond angle | 1.241 |
Refinement software | REFMAC (5.5.0109) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 46.700 |
High resolution limit [Å] | 1.880 |
Number of reflections | 8847 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 291 | 25 % tert-butanol and 100 mM Tris pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K |
1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 291 | 25 % tert-butanol and 100 mM Tris pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K |