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4H4L

Crystal Structure of ternary complex of HutP(HutP-L-His-Zn)

Replaces:  2ZH0
Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsPHOTON FACTORY BEAMLINE BL-5A
Synchrotron sitePhoton Factory
BeamlineBL-5A
Temperature [K]100
Detector technologyCCD
Collection date2007-10-07
DetectorADSC QUANTUM 315
Wavelength(s)1.25363
Spacegroup nameP 3
Unit cell lengths129.530, 129.530, 76.670
Unit cell angles90.00, 90.00, 120.00
Refinement procedure
Resolution36.280 - 2.500
R-factor0.22331
Rwork0.219
R-free0.29778
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)1vea
RMSD bond length0.011
RMSD bond angle1.626
Data reduction softwareHKL-2000
Data scaling softwareHKL-2000
Phasing softwarePHASER
Refinement softwareREFMAC (5.6.0117)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]50.0002.380
High resolution limit [Å]2.3002.300
Rmerge0.1190.515
Number of reflections57983
<I/σ(I)>15.71.1
Completeness [%]90.052
Redundancy52.7
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP7.629330% PEG 2K MME, 0.1M HEPES PH7.6, 0.5M KBR, 10MM ZINC ACETATE, 0.2M L-HIS, VAPOR DIFFUSION, HANGING DROP, temperature 293K

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