4GFK
structures of NO factors
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 8.3.1 |
Synchrotron site | ALS |
Beamline | 8.3.1 |
Temperature [K] | 100 |
Detector technology | CCD |
Detector | ADSC QUANTUM 4 |
Wavelength(s) | 1.111 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 85.870, 43.200, 107.700 |
Unit cell angles | 90.00, 96.25, 90.00 |
Refinement procedure
Resolution | 41.220 - 1.950 |
R-factor | 0.212 |
Rwork | 0.212 |
R-free | 0.23900 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.020 |
RMSD bond angle | 1.600 |
Refinement software | CNS (1.2) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 107.000 |
High resolution limit [Å] | 1.950 |
Number of reflections | 28300 |
Completeness [%] | 98.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | peg, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 298K |