4FBY
fs X-ray diffraction of Photosystem II
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SLAC LCLS BEAMLINE CXI |
Synchrotron site | SLAC LCLS |
Beamline | CXI |
Temperature [K] | 298 |
Detector technology | PIXEL |
Collection date | 2011-09-19 |
Detector | CS-PAD |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 130.783, 227.764, 308.630 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 85.890 - 6.560 |
R-factor | 0.367 |
Rwork | 0.366 |
R-free | 0.38500 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3BZ1 |
RMSD bond length | 0.007 |
RMSD bond angle | 1.483 |
Data reduction software | cctbx.xfel |
Phasing software | PHASER |
Refinement software | PHENIX (1.7.3) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 85.890 | 6.730 |
High resolution limit [Å] | 6.556 | 6.500 |
Number of reflections | 17962 | |
<I/σ(I)> | 6.74 | |
Completeness [%] | 98.1 | 89.6 |
Redundancy | 2.84 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 7 | 298 | 4% PEG 2000, 5 mM CaCl2, 100 mM PIPES, pH 7.0, batch, temperature 298K |