4XL5
X-ray structure of bGFP-A / EGFP complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SOLEIL BEAMLINE PROXIMA 1 |
| Synchrotron site | SOLEIL |
| Beamline | PROXIMA 1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2014-02-08 |
| Detector | PSI PILATUS 6M |
| Wavelength(s) | 0.97857 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 72.280, 45.980, 74.890 |
| Unit cell angles | 90.00, 90.76, 90.00 |
Refinement procedure
| Resolution | 39.180 - 2.000 |
| R-factor | 0.208 |
| Rwork | 0.205 |
| R-free | 0.26799 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1jbz 3ltj |
| RMSD bond length | 0.014 |
| RMSD bond angle | 1.746 |
| Data reduction software | XDS (January 10, 2014) |
| Data scaling software | XSCALE (January 10, 2014) |
| Phasing software | PHASER (2.5.2) |
| Refinement software | REFMAC (5.8.0069) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 39.200 | 2.100 |
| High resolution limit [Å] | 2.000 | 2.000 |
| Rmerge | 0.052 | 0.770 |
| Number of reflections | 33143 | |
| <I/σ(I)> | 14.3 | 2 |
| Completeness [%] | 98.5 | 98.1 |
| Redundancy | 3 | 3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.05M MgAc, 0.1M NaAc, 5%-15% PEG 8K |
