4XL5
X-ray structure of bGFP-A / EGFP complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SOLEIL BEAMLINE PROXIMA 1 |
Synchrotron site | SOLEIL |
Beamline | PROXIMA 1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2014-02-08 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.97857 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 72.280, 45.980, 74.890 |
Unit cell angles | 90.00, 90.76, 90.00 |
Refinement procedure
Resolution | 39.180 - 2.000 |
R-factor | 0.208 |
Rwork | 0.205 |
R-free | 0.26799 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1jbz 3ltj |
RMSD bond length | 0.014 |
RMSD bond angle | 1.746 |
Data reduction software | XDS (January 10, 2014) |
Data scaling software | XSCALE (January 10, 2014) |
Phasing software | PHASER (2.5.2) |
Refinement software | REFMAC (5.8.0069) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 39.200 | 2.100 |
High resolution limit [Å] | 2.000 | 2.000 |
Rmerge | 0.052 | 0.770 |
Number of reflections | 33143 | |
<I/σ(I)> | 14.3 | 2 |
Completeness [%] | 98.5 | 98.1 |
Redundancy | 3 | 3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.05M MgAc, 0.1M NaAc, 5%-15% PEG 8K |