4XFV
Crystal Structure of Elp2
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U |
Synchrotron site | SSRF |
Beamline | BL17U |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2012-12-24 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.9792 |
Spacegroup name | P 61 2 2 |
Unit cell lengths | 80.645, 80.645, 535.793 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 48.000 - 3.200 |
R-factor | 0.199 |
Rwork | 0.199 |
R-free | 0.24100 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3fm0 |
RMSD bond length | 0.006 |
RMSD bond angle | 1.200 |
Phasing software | PHASER |
Refinement software | CNS (1.3) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 48.000 |
High resolution limit [Å] | 3.200 |
Number of reflections | 16120 |
<I/σ(I)> | 15 |
Completeness [%] | 87.8 |
Redundancy | 20 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 4.8 | 293 | 0.1 M Citric acid, 3.4 M NaCl |