4XDN
Crystal structure of Scc4 in complex with Scc2n
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-E |
| Synchrotron site | APS |
| Beamline | 24-ID-E |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2013-04-08 |
| Detector | ADSC QUANTUM 315 |
| Wavelength(s) | 1.000 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 51.579, 177.279, 51.343 |
| Unit cell angles | 90.00, 111.11, 90.00 |
Refinement procedure
| Resolution | 28.720 - 2.080 |
| R-factor | 0.186 |
| Rwork | 0.185 |
| R-free | 0.21000 |
| Structure solution method | SAD |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | SHELXDE |
| Refinement software | PHENIX |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 30.000 | 2.140 |
| High resolution limit [Å] | 2.079 | 2.079 |
| Rmerge | 0.098 | 0.762 |
| Number of reflections | 50794 | |
| <I/σ(I)> | 9.4 | |
| Completeness [%] | 99.9 | 100 |
| Redundancy | 3.7 | 3.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 291.15 | overnight growth in .2M ammonium sulfate, 16% (w:v) PEG 3350 |
