4RV0
Crystal structure of TN complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | BSRF BEAMLINE 1W2B |
Synchrotron site | BSRF |
Beamline | 1W2B |
Temperature [K] | 100 |
Detector technology | IMAGE PLATE |
Collection date | 2012-09-18 |
Detector | MAR scanner 345 mm plate |
Wavelength(s) | 0.9791 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 80.146, 83.141, 162.495 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 45.384 - 1.998 |
R-factor | 0.2104 |
Rwork | 0.208 |
R-free | 0.25310 |
Structure solution method | SAD |
RMSD bond length | 0.008 |
RMSD bond angle | 1.281 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | AutoSol |
Refinement software | PHENIX ((phenix.refine: 1.8.1_1168)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.030 |
High resolution limit [Å] | 1.998 | 2.000 |
Rmerge | 0.160 | 0.638 |
Number of reflections | 74127 | |
<I/σ(I)> | 2.18 | |
Completeness [%] | 99.8 | 95.6 |
Redundancy | 14.1 | 6.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 289 | 0.1M Tris pH 8.5, 23% w/v polyethylene glycol 3350, 0.2M ammonium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 289K |