4OVV
Crystal Structure of PI3Kalpha in complex with diC4-PIP2
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSLS BEAMLINE X25 |
Synchrotron site | NSLS |
Beamline | X25 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2009-04-30 |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 0.9788 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 114.259, 116.083, 148.743 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 91.510 - 3.500 |
R-factor | 0.2418 |
Rwork | 0.237 |
R-free | 0.33880 |
RMSD bond length | 0.015 |
RMSD bond angle | 1.865 |
Data reduction software | DENZO |
Data scaling software | SCALEPACK |
Refinement software | REFMAC (5.6.0117) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 50.000 | 50.000 | 3.420 |
High resolution limit [Å] | 3.360 | 9.100 | 3.360 |
Rmerge | 0.103 | 0.036 | 0.712 |
Total number of observations | 256465 | ||
Number of reflections | 28636 | ||
<I/σ(I)> | 10.9 | ||
Completeness [%] | 99.9 | 98.4 | 100 |
Redundancy | 9 | 8 | 9.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 6.8 | 298 | NaFormate |