4OU6
Crystal structure of DnaT84-153-dT10 ssDNA complex form 1
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U |
| Synchrotron site | SSRF |
| Beamline | BL17U |
| Wavelength(s) | 0.97930 |
| Spacegroup name | P 1 |
| Unit cell lengths | 47.144, 47.416, 54.135 |
| Unit cell angles | 88.34, 86.25, 71.24 |
Refinement procedure
| Resolution | 27.540 - 1.960 |
| R-factor | 0.19056 |
| Rwork | 0.189 |
| R-free | 0.22846 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.209 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.7.0032) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 27.540 |
| High resolution limit [Å] | 1.960 |
| Number of reflections | 30764 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | VAPOR DIFFUSION, HANGING DROP |
