4KMH
Crystal structure of Suppressor of Fused d20
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U |
| Synchrotron site | SSRF |
| Beamline | BL17U |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2012-05-25 |
| Wavelength(s) | 1.000 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 73.634, 122.329, 118.751 |
| Unit cell angles | 90.00, 90.41, 90.00 |
Refinement procedure
| Resolution | 50.000 - 3.040 |
| R-factor | 0.2266 |
| Rwork | 0.224 |
| R-free | 0.27700 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4km8 |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.974 |
| Data reduction software | DENZO |
| Data scaling software | SCALEPACK |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.5.0102) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 118.750 | 50.000 | 3.210 |
| High resolution limit [Å] | 3.040 | 6.670 | 3.100 |
| Rmerge | 0.128 | 0.111 | 0.489 |
| Number of reflections | 19786 | ||
| <I/σ(I)> | 13.2 | ||
| Completeness [%] | 99.4 | 97.9 | 99.8 |
| Redundancy | 5.6 | 5.4 | 5.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 287 | 16% PEG 3350, 0.1M Ammonium Tartrate, vapor diffusion, hanging drop, temperature 287K |
