4GFK
structures of NO factors
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 8.3.1 |
| Synchrotron site | ALS |
| Beamline | 8.3.1 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Detector | ADSC QUANTUM 4 |
| Wavelength(s) | 1.111 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 85.870, 43.200, 107.700 |
| Unit cell angles | 90.00, 96.25, 90.00 |
Refinement procedure
| Resolution | 41.220 - 1.950 |
| R-factor | 0.212 |
| Rwork | 0.212 |
| R-free | 0.23900 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.020 |
| RMSD bond angle | 1.600 |
| Refinement software | CNS (1.2) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 107.000 |
| High resolution limit [Å] | 1.950 |
| Number of reflections | 28300 |
| Completeness [%] | 98.9 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | peg, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 298K |
