4FUX
Crystal Structure of the ERK2 complexed with E75
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | ROTATING ANODE |
Source details | RIGAKU |
Temperature [K] | 100 |
Detector technology | IMAGE PLATE |
Detector | RIGAKU RAXIS IIC |
Wavelength(s) | 1.5418 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 48.703, 70.283, 60.372 |
Unit cell angles | 90.00, 109.09, 90.00 |
Refinement procedure
Resolution | 23.330 - 2.200 |
R-factor | 0.1893 |
Rwork | 0.187 |
R-free | 0.22300 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.010 |
RMSD bond angle | 0.990 |
Data scaling software | SCALEPACK |
Refinement software | BUSTER-TNT (BUSTER 2.11.1) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 55.000 | 55.000 | 2.260 |
High resolution limit [Å] | 2.200 | 5.040 | 2.200 |
Rmerge | 0.033 | 0.029 | 0.088 |
Number of reflections | 18031 | ||
<I/σ(I)> | 23.8 | ||
Completeness [%] | 92.1 | 82 | 92.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 6.5 | 298 | 100 mM MES buffer, pH 6.5, 26-28% PEG-MME 2000, 200 mM ammonium sulfate and 20 mM 2-mercaptoethanol, vapor diffusion, temperature 298K |