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3VXK

Crystal structure of OsD14

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsPHOTON FACTORY BEAMLINE AR-NE3A
Synchrotron sitePhoton Factory
BeamlineAR-NE3A
Temperature [K]77
Detector technologyCCD
Collection date2011-11-26
DetectorADSC QUANTUM 270
Wavelength(s)1.0000
Spacegroup nameP 21 21 21
Unit cell lengths48.140, 88.720, 118.610
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution20.000 - 1.750
R-factor0.18283
Rwork0.181
R-free0.22261
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)1wom
RMSD bond length0.023
RMSD bond angle1.933
Data reduction softwareXDS
Data scaling softwareXSCALE
Phasing softwareMOLREP
Refinement softwareREFMAC (5.5.0109)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]20.0001.800
High resolution limit [Å]1.7501.750
Number of reflections51922
<I/σ(I)>226.5
Redundancy7.15.5
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP7.52938% PEG 20000, 2% 1,4-dioxane, 0.1M HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

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