3VXK
Crystal structure of OsD14
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PHOTON FACTORY BEAMLINE AR-NE3A |
Synchrotron site | Photon Factory |
Beamline | AR-NE3A |
Temperature [K] | 77 |
Detector technology | CCD |
Collection date | 2011-11-26 |
Detector | ADSC QUANTUM 270 |
Wavelength(s) | 1.0000 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 48.140, 88.720, 118.610 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 20.000 - 1.750 |
R-factor | 0.18283 |
Rwork | 0.181 |
R-free | 0.22261 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1wom |
RMSD bond length | 0.023 |
RMSD bond angle | 1.933 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | MOLREP |
Refinement software | REFMAC (5.5.0109) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 20.000 | 1.800 |
High resolution limit [Å] | 1.750 | 1.750 |
Number of reflections | 51922 | |
<I/σ(I)> | 22 | 6.5 |
Redundancy | 7.1 | 5.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 293 | 8% PEG 20000, 2% 1,4-dioxane, 0.1M HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K |