3VLB
Crystal structure of xeg-edgp
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SPRING-8 BEAMLINE BL32XU |
Synchrotron site | SPring-8 |
Beamline | BL32XU |
Detector technology | CCD |
Collection date | 2011-05-20 |
Detector | RAYONIX MX225HE |
Wavelength(s) | 1 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 249.043, 51.691, 143.235 |
Unit cell angles | 90.00, 122.21, 90.00 |
Refinement procedure
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 2.700 |
Number of reflections | 40308 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 |