3TE1
Crystal structure of HSC T84A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSLS BEAMLINE X25 |
Synchrotron site | NSLS |
Beamline | X25 |
Temperature [K] | 100 |
Detector technology | CCD |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 0.975 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 99.036, 118.413, 150.845 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 48.160 - 2.390 |
R-factor | 0.215 |
Rwork | 0.213 |
R-free | 0.27500 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.014 |
RMSD bond angle | 1.448 |
Data reduction software | DENZO |
Data scaling software | SCALEPACK |
Refinement software | PHENIX (1.7.1_743) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 50.000 | 50.000 | 2.440 |
High resolution limit [Å] | 2.390 | 6.510 | 2.400 |
Rmerge | 0.091 | 0.035 | 0.803 |
Number of reflections | 69827 | ||
<I/σ(I)> | 7.1 | ||
Completeness [%] | 99.2 | 99.2 | 98.8 |
Redundancy | 6.8 | 7 | 6.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 9 | 298 | PEG 400, pH 9.0, VAPOR DIFFUSION, temperature 298K |