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3RMP

Structural basis for the recognition of attP substrates by P4-like integrases

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSLS BEAMLINE X10SA
Synchrotron siteSLS
BeamlineX10SA
Temperature [K]90
Detector technologyCCD
Collection date2009-08-12
DetectorMARRESEARCH
Spacegroup nameP 21 21 21
Unit cell lengths60.900, 69.490, 83.740
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution19.730 - 2.210
R-factor0.23625
Rwork0.234
R-free0.28021
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)3jtz
RMSD bond length0.008
RMSD bond angle2.847
Data reduction softwareXDS
Data scaling softwareXSCALE
Phasing softwareMOLREP
Refinement softwareREFMAC (5.5.0072)
Data quality characteristics
 Overall
Low resolution limit [Å]45.800
High resolution limit [Å]2.100
Rmerge0.066
Number of reflections14688
<I/σ(I)>17.09
Completeness [%]81.5
Redundancy4.2
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP527765% MPD, 0.1 M sodium acetate, pH 5.0, VAPOR DIFFUSION, SITTING DROP, temperature 277K

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