3JUE
Crystal Structure of ArfGAP and ANK repeat domain of ACAP1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PHOTON FACTORY BEAMLINE BL-17A |
Synchrotron site | Photon Factory |
Beamline | BL-17A |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2008-11-10 |
Detector | ADSC QUANTUM 270 |
Wavelength(s) | 1.28 |
Spacegroup name | P 21 21 2 |
Unit cell lengths | 107.809, 163.473, 41.092 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 45.000 - 2.300 |
R-factor | 0.20321 |
Rwork | 0.202 |
R-free | 0.21936 |
Structure solution method | SAD |
RMSD bond length | 0.011 |
RMSD bond angle | 1.272 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | SOLVE |
Refinement software | REFMAC (5.5.0088) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 48.630 | 2.280 |
High resolution limit [Å] | 2.200 | 2.200 |
Rmerge | 0.067 | 0.351 |
Number of reflections | 36997 | |
<I/σ(I)> | 19.9 | 1.58 |
Completeness [%] | 97.3 | 81.8 |
Redundancy | 5.6 | 3.3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 5.1 | 289 | 0.2M ammonium sulfate, 14% PEG 3350, 0.1M Sodium Citrate, pH 5.1, VAPOR DIFFUSION, HANGING DROP, temperature 289K |