3IZP
Conformation of EF-G during translocation
EM specimen
| Vitrification | Yes |
| Method | two-face blotting for 1 second |
EM Data Collection
| Microscope | FEI TECNAI F20 |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 200 |
| Cs (mm) | 2 |
| Detector | KODAK SO-163 FILM |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Software | MDFF |
| Symmetry | C1 |
