3VLB
Crystal structure of xeg-edgp
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL32XU |
| Synchrotron site | SPring-8 |
| Beamline | BL32XU |
| Detector technology | CCD |
| Collection date | 2011-05-20 |
| Detector | RAYONIX MX225HE |
| Wavelength(s) | 1 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 249.043, 51.691, 143.235 |
| Unit cell angles | 90.00, 122.21, 90.00 |
Refinement procedure
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 50.000 |
| High resolution limit [Å] | 2.700 |
| Number of reflections | 40308 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 |






