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3VEP

Crystal structure of SigD4 in complex with its negative regulator RsdA

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsESRF BEAMLINE BM14
Synchrotron siteESRF
BeamlineBM14
Temperature [K]100
Detector technologyCCD
Collection date2010-06-05
DetectorMARMOSAIC 300 mm CCD
Wavelength(s)0.978
Spacegroup nameC 1 2 1
Unit cell lengths99.740, 110.720, 73.130
Unit cell angles90.00, 133.00, 90.00
Refinement procedure
Resolution38.465 - 2.500
R-factor0.245
Rwork0.243
R-free0.28660
Structure solution methodSAD
RMSD bond length0.012
RMSD bond angle1.606
Data reduction softwareMOSFLM
Data scaling softwareSCALA
Phasing softwareSOLVE
Refinement softwarePHENIX ((phenix.refine: 1.6.4_486))
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]38.4652.640
High resolution limit [Å]2.5002.500
Rmerge0.0680.442
Number of reflections18114
<I/σ(I)>15.64.4
Completeness [%]86.498
Redundancy7.77.7
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1OIL-BATCH7.43001.0-103M Ammonium Sulphate, 0.1M HEPES, 15-20% PEG 4000, pH 7.4, OIL-BATCH, temperature 300K

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