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3JUE

Crystal Structure of ArfGAP and ANK repeat domain of ACAP1

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsPHOTON FACTORY BEAMLINE BL-17A
Synchrotron sitePhoton Factory
BeamlineBL-17A
Temperature [K]100
Detector technologyCCD
Collection date2008-11-10
DetectorADSC QUANTUM 270
Wavelength(s)1.28
Spacegroup nameP 21 21 2
Unit cell lengths107.809, 163.473, 41.092
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution45.000 - 2.300
R-factor0.20321
Rwork0.202
R-free0.21936
Structure solution methodSAD
RMSD bond length0.011
RMSD bond angle1.272
Data reduction softwareHKL-2000
Data scaling softwareHKL-2000
Phasing softwareSOLVE
Refinement softwareREFMAC (5.5.0088)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]48.6302.280
High resolution limit [Å]2.2002.200
Rmerge0.0670.351
Number of reflections36997
<I/σ(I)>19.91.58
Completeness [%]97.381.8
Redundancy5.63.3
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP5.12890.2M ammonium sulfate, 14% PEG 3350, 0.1M Sodium Citrate, pH 5.1, VAPOR DIFFUSION, HANGING DROP, temperature 289K

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