3EQR
Crystal Structure of Ack1 with compound T74
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 5.0.2 |
Synchrotron site | ALS |
Beamline | 5.0.2 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2005-01-20 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 70.785, 42.915, 92.832 |
Unit cell angles | 90.00, 99.67, 90.00 |
Refinement procedure
Resolution | 91.290 - 2.000 |
R-factor | 0.212 |
Rwork | 0.210 |
R-free | 0.25600 |
RMSD bond length | 0.011 |
RMSD bond angle | 1.381 |
Data scaling software | SCALA (3.1.20) |
Refinement software | REFMAC (5.5.0044) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 91.515 | 91.510 | 2.110 |
High resolution limit [Å] | 2.000 | 6.320 | 2.000 |
Rmerge | 0.122 | 0.043 | 0.423 |
Total number of observations | 4267 | 16994 | |
Number of reflections | 35597 | ||
<I/σ(I)> | 4.3 | 12.8 | 1.8 |
Completeness [%] | 94.4 | 99.8 | 91.9 |
Redundancy | 3.3 | 3.3 | 3.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 298 | vapor diffusion, temperature 298K |