3EQR
Crystal Structure of Ack1 with compound T74
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.2 |
| Synchrotron site | ALS |
| Beamline | 5.0.2 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2005-01-20 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 70.785, 42.915, 92.832 |
| Unit cell angles | 90.00, 99.67, 90.00 |
Refinement procedure
| Resolution | 91.290 - 2.000 |
| R-factor | 0.212 |
| Rwork | 0.210 |
| R-free | 0.25600 |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.381 |
| Data scaling software | SCALA (3.1.20) |
| Refinement software | REFMAC (5.5.0044) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 91.515 | 91.510 | 2.110 |
| High resolution limit [Å] | 2.000 | 6.320 | 2.000 |
| Rmerge | 0.122 | 0.043 | 0.423 |
| Total number of observations | 4267 | 16994 | |
| Number of reflections | 35597 | ||
| <I/σ(I)> | 4.3 | 12.8 | 1.8 |
| Completeness [%] | 94.4 | 99.8 | 91.9 |
| Redundancy | 3.3 | 3.3 | 3.4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 298 | vapor diffusion, temperature 298K |






