3C0W
I-SceI in complex with a bottom nicked DNA substrate
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 19-ID |
Synchrotron site | APS |
Beamline | 19-ID |
Temperature [K] | 93 |
Detector technology | CCD |
Wavelength(s) | 0.979 |
Spacegroup name | P 41 21 2 |
Unit cell lengths | 80.610, 80.610, 127.090 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 28.000 - 2.200 |
Rwork | 0.268 |
R-free | 0.28700 |
Starting model (for MR) | 1r7m |
RMSD bond length | 0.008 |
RMSD bond angle | 1.530 |
Data reduction software | d*TREK |
Data scaling software | d*TREK |
Phasing software | MOLREP |
Refinement software | CNS |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 28.510 | 2.180 |
High resolution limit [Å] | 2.100 | 2.100 |
Rmerge | 0.061 | 0.516 |
Number of reflections | 25122 | |
<I/σ(I)> | 15 | 3.1 |
Completeness [%] | 99.7 | 100 |
Redundancy | 9.21 | 9.24 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 4.6 | 277 | pH 4.6, VAPOR DIFFUSION, temperature 277K |