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3C0W

I-SceI in complex with a bottom nicked DNA substrate

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsAPS BEAMLINE 19-ID
Synchrotron siteAPS
Beamline19-ID
Temperature [K]93
Detector technologyCCD
Wavelength(s)0.979
Spacegroup nameP 41 21 2
Unit cell lengths80.610, 80.610, 127.090
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution28.000 - 2.200
Rwork0.268
R-free0.28700
Starting model (for MR)1r7m
RMSD bond length0.008
RMSD bond angle1.530
Data reduction softwared*TREK
Data scaling softwared*TREK
Phasing softwareMOLREP
Refinement softwareCNS
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]28.5102.180
High resolution limit [Å]2.1002.100
Rmerge0.0610.516
Number of reflections25122
<I/σ(I)>153.1
Completeness [%]99.7100
Redundancy9.219.24
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION4.6277pH 4.6, VAPOR DIFFUSION, temperature 277K

220113

PDB entries from 2024-05-22

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