3C0W
I-SceI in complex with a bottom nicked DNA substrate
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 19-ID |
| Synchrotron site | APS |
| Beamline | 19-ID |
| Temperature [K] | 93 |
| Detector technology | CCD |
| Wavelength(s) | 0.979 |
| Spacegroup name | P 41 21 2 |
| Unit cell lengths | 80.610, 80.610, 127.090 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 28.000 - 2.200 |
| Rwork | 0.268 |
| R-free | 0.28700 |
| Starting model (for MR) | 1r7m |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.530 |
| Data reduction software | d*TREK |
| Data scaling software | d*TREK |
| Phasing software | MOLREP |
| Refinement software | CNS |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 28.510 | 2.180 |
| High resolution limit [Å] | 2.100 | 2.100 |
| Rmerge | 0.061 | 0.516 |
| Number of reflections | 25122 | |
| <I/σ(I)> | 15 | 3.1 |
| Completeness [%] | 99.7 | 100 |
| Redundancy | 9.21 | 9.24 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 4.6 | 277 | pH 4.6, VAPOR DIFFUSION, temperature 277K |






