36OL
Crystal Structure of KRAS WT complexed with GMPPNP
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 23-ID-B |
| Synchrotron site | APS |
| Beamline | 23-ID-B |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-05-29 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1.03317 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 48.890, 62.990, 119.380 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 43.330 - 2.050 |
| R-factor | 0.1832 |
| Rwork | 0.180 |
| R-free | 0.23630 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.842 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.21.1_5286) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 43.330 | 2.110 |
| High resolution limit [Å] | 2.050 | 2.050 |
| Rmerge | 0.187 | 1.200 |
| Rpim | 0.064 | 0.564 |
| Number of reflections | 23880 | 1807 |
| <I/σ(I)> | 8.3 | 2.1 |
| Completeness [%] | 100.0 | |
| Redundancy | 10 | |
| CC(1/2) | 0.995 | 0.670 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 291 | 0.2 M LiCl, 25% PEG 8000 |






