35UI
Crystal structure of TFPI K2 domain in complex with TFPI-24 Fab fragment
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2013-03-23 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 42.817, 71.362, 148.729 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 28.960 - 1.750 |
| R-factor | 0.1919 |
| Rwork | 0.190 |
| R-free | 0.22690 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.180 |
| Data reduction software | autoPROC |
| Data scaling software | autoPROC |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.1) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 28.960 | 1.790 |
| High resolution limit [Å] | 1.750 | 1.750 |
| Rmerge | 0.055 | 0.170 |
| Rmeas | 0.060 | 0.190 |
| Number of reflections | 46840 | 3428 |
| <I/σ(I)> | 7.27 | 4.13 |
| Completeness [%] | 99.8 | 99.82 |
| Redundancy | 5.76 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 20 % PEG 3350, 200 mM ammonium nitrate |
