30JEEM specimen
| Vitrification | Yes |
EM Data Collection
| Microscope | TFS KRIOS |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 300 |
| Detector | FEI FALCON IV (4k x 4k) |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 3.5 |
| Software | crYOLO,cryoSPARC,PHENIX |
| CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |
