2XKY
Single particle analysis of Kir2.1NC_4 in negative stain
Refinement Statistics
Experimental method: ELECTRON MICROSCOPY (17.2 Å), SOLUTION SCATTERING
| Cell axes | 1.000 | 1.000 | 1.000 |
| Cell angles | 90.00 | 90.00 | 90.00 |
| Spacegroup | P 1 | ||
| Resolution limits | - 17.20 | ||
EM specimen
| Staining | Yes |
| Staining material | Uranyl Acetate |
EM Data Collection
| Microscope | FEI TECNAI 10 |
| Electron Gun | TUNGSTEN HAIRPIN |
| Accelerating Voltage (kV) | 100 |
| Cs (mm) | 2 |
| Detector | GENERIC GATAN |
| Number of Images | 22 |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 17.2 |
| Software | UCSF Chimera,EMAN |
| Symmetry | C4 |
