2WVN
Structure of the HET-s N-terminal domain
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Detector | DECTRIS PILATUS 6M |
Spacegroup name | P 4 3 2 |
Unit cell lengths | 122.660, 122.660, 122.660 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 38.780 - 2.620 |
R-factor | 0.219 |
Rwork | 0.216 |
R-free | 0.27000 |
Structure solution method | MIRAS |
Starting model (for MR) | NONE |
RMSD bond length | 0.018 |
RMSD bond angle | 1.843 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | SHARP |
Refinement software | REFMAC (5.2.0019) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 40.000 | 2.770 |
High resolution limit [Å] | 2.620 | 2.620 |
Rmerge | 0.060 | 0.463 |
Number of reflections | 10044 | |
<I/σ(I)> | 24.1 | 3.9 |
Completeness [%] | 99.7 | 99 |
Redundancy | 10.1 | 10.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 8 | 292 | CRYSTALLIZED AT 292K WITH 20 MM TRIS PH 8.0, 30% PEG4000 |