2NTS
Crystal Structure of SEK-hVb5.1
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS BEAMLINE X9A |
| Synchrotron site | NSLS |
| Beamline | X9A |
| Detector technology | AREA DETECTOR |
| Wavelength(s) | 0.9779 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 38.591, 108.031, 128.743 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 25.000 - 2.400 |
| Rwork | 0.219 |
| R-free | 0.24000 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | PDB models 2ICI and 1ZGL |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.687 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | CNS |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 25.000 |
| High resolution limit [Å] | 2.400 |
| Number of reflections | 21526 |
| <I/σ(I)> | 25.9 |
| Completeness [%] | 99.9 |
| Redundancy | 8.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | VAPOR DIFFUSION, HANGING DROP |
