2FGR
High resolution Xray structure of Omp32
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ESRF BEAMLINE ID14-4 |
Synchrotron site | ESRF |
Beamline | ID14-4 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2002-12-01 |
Detector | ADSC QUANTUM 4 |
Wavelength(s) | 1.0053 |
Spacegroup name | P 63 |
Unit cell lengths | 106.410, 106.410, 93.790 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 20.000 - 1.500 |
R-factor | 0.151 |
Rwork | 0.150 |
R-free | 0.18000 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.021 |
RMSD bond angle | 1.696 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | MOLREP |
Refinement software | REFMAC (5.1.24) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 20.000 | 1.590 |
High resolution limit [Å] | 1.500 | 1.500 |
Number of reflections | 92517 | |
Completeness [%] | 92.1 | 78.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 293 | PEG4000, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 20K, temperature 293K |