2AXZ
Crystal structure of PrgX/cCF10 complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 19-ID |
| Synchrotron site | APS |
| Beamline | 19-ID |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2004-03-03 |
| Wavelength(s) | 0.97940 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 71.076, 83.903, 286.804 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 40.000 - 3.000 |
| R-factor | 0.23 |
| Rwork | 0.228 |
| R-free | 0.28800 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Refinement software | CNS (1.1) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 40.000 |
| High resolution limit [Å] | 3.000 |
| Number of reflections | 32729 |
| Completeness [%] | 92.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 5 | 298 | PEG 4000, citrate-phophate , pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K |
