2AXV
Structure of PrgX Y153C mutant
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSLS BEAMLINE X25 |
Synchrotron site | NSLS |
Beamline | X25 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2004-03-03 |
Wavelength(s) | 0.97940 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 82.076, 82.076, 263.480 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 20.000 - 3.000 |
R-factor | 0.24156 |
Rwork | 0.239 |
R-free | 0.27962 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.019 |
RMSD bond angle | 1.708 |
Refinement software | REFMAC (5.2.0005) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 45.000 |
High resolution limit [Å] | 3.000 |
Number of reflections | 47514 |
Completeness [%] | 95.3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 5 | 298 | PEG 4000, citrate-phophate, pH 5.0, VAPOR DIFFUSION, temperature 298K |